{"id":243732,"date":"2026-09-08T18:02:26","date_gmt":"2026-09-08T16:02:26","guid":{"rendered":"https:\/\/efecomunica.efe.com\/?p=243732"},"modified":"2026-09-09T03:49:07","modified_gmt":"2026-09-09T01:49:07","slug":"tektronix-expands-mp5000-series-with-200-volt-smu-to","status":"publish","type":"post","link":"https:\/\/efecomunica.efe.com\/en\/tektronix-expands-mp5000-series-with-200-volt-smu-to\/","title":{"rendered":"Tektronix expands MP5000 Series with 200-volt SMU to accelerate semiconductor and optical device validation"},"content":{"rendered":"<p><span style=\"font-weight: 400;\">(Statement issued by the company (Announcement)<\/span><\/p>\n<div>\n<p><strong>Tektronix\u00a0<\/strong>today\u00a0announced the MSMU200-2 <strong>Source<\/strong> <strong>Measure<\/strong> <strong>Unit<\/strong> (SMU) module for the <strong>MP5000 Series\u00a0Modular\u00a0Precision Test\u00a0System<\/strong>. The new module expands\u00a0the platform to support higher-voltage semiconductor characterization, device reliability and stress testing, and validation of optical and integrated devices.<\/p>\n<p>Built\u00a0on\u00a0<strong>Keithley\u2122\u2019s<\/strong>\u00a0source-measure\u00a0expertise, the dual-channel MSMU200-2\u00a0SMU\u00a0delivers\u00a0a 30-watt power envelope spanning up to 200 volts and 1.5 amps DC, plus extended pulse capability up to 7 amps.<\/p>\n<p>As AI infrastructure, high-speed optical connectivity and <strong>increasingly<\/strong> <strong>integrated<\/strong> <strong>semiconductor<\/strong> designs drive greater device\u00a0complexity,\u00a0engineers face growing pressure to\u00a0identify\u00a0interactions and potential failures earlier. Testing individual components late in development is no longer sufficient. Teams need deeper, more system-level insight earlier in the design cycle, when problems are faster and less expensive to correct.<\/p>\n<p>\u201cThe costliest test failure is the one discovered after complex design has already moved downstream,\u201d said Javier Irazola, <strong>Vice President and General Manager<\/strong> of the Precision DC Source and Measure Portfolio at Tektronix. \u201cBy adding higher-voltage operation, extended current pulsing capabilities and new, intuitive control for synchronized, high-channel-count parallel testing in the MP5000 Series system, we\u2019re giving engineers a practical way to move deeper characterization earlier, then carry the same modular architecture into production as channel counts and test requirements grow.\u201d<\/p>\n<p><strong>Higher-voltage\u00a0operation\u00a0for\u00a0broader\u00a0device testing\u00a0<\/strong><\/p>\n<p>The MSMU200-2 SMU is designed for semiconductor, integrated circuit and optoelectronic applications that require higher voltage, pulsed\u00a0measurements\u00a0or precise coordination across multiple device terminals. Target applications include semiconductor device characterization, package-level reliability\u00a0testing\u00a0and semiconductor chip validation,\u00a0including\u00a0application-specific\u00a0integrated circuits and field-programmable\u00a0gate arrays.<\/p>\n<p>Key capabilities include:<\/p>\n<p>&nbsp;<\/p>\n<ul>\n<li><strong>Higher-voltage characterization and stress testing:<\/strong>\u00a0Two independent SMU channels\u00a0deliver a 30-watt\u00a0power envelope,\u00a0with sourcing and measurement up\u00a0to 200 volts\u00a0and 1.5\u00a0amps\u00a0DC,\u00a0depending on the\u00a0operating point.<\/li>\n<li><strong>Extended pulsing with less device self-heating: <\/strong>Pulse capability up to 7 amps allows engineers to apply higher-current test conditions\u00a0in\u00a0controlled\u00a0bursts as short as\u00a0hundreds of microseconds,\u00a0depending on the source range and device impedance.\u00a0This helps limit device self-heating\u00a0that can distort measurements, obscure actual device\u00a0behavior\u00a0or damage the device under test.<\/li>\n<li><strong>High-speed transient capture:<\/strong>\u00a0Integrated digitizers simultaneously sample voltage and current at up to 1 million samples per second, allowing engineers to capture fast transient events and pulse waveforms without adding a separate digitizer or oscilloscope for many DC and pulse measurements.<\/li>\n<li><strong>Greater confidence in test connections:<\/strong>Built-in Contact Check\u00a0can be\u00a0automated\u00a0to\u00a0verify\u00a0force and sense connections before testing begins, helping prevent invalid measurements caused by poor contact with the device under test.<\/li>\n<li><strong>Device and instrument protection:<\/strong>\u00a0Input\u00a0overvoltage protection and optional autosense capability help protect sensitive devices, probes and instruments during demanding tests and unexpected connection conditions.<\/li>\n<li><strong>\u201cSmart\u201d current sinking:<\/strong>\u00a0Independently programmable\u00a0positive and negative limits allow engineers to control sourcing and sinking differently. This\u00a0reduces\u00a0the need to create custom algorithms to prevent excessive sinking current when testing power-management integrated circuits, voltage regulators,\u00a0batteries\u00a0and other sensitive devices.<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p><strong>TriggerFlow\u00a0simplifies synchronized parallel testing\u00a0<\/strong><\/p>\n<p>The new\u00a0TriggerFlow\u2122\u00a0graphical interface in TSP\u2122\u00a0Toolkit makes it easier to build, visualize and debug synchronized parallel test sequences across MP5000 Series channels and connected instruments.<\/p>\n<p>Engineers can use\u00a0TriggerFlow\u00a0to define when a channel changes its source level, takes a measurement, responds to an\u00a0event\u00a0or coordinates with external equipment such as probers and handlers. They can also\u00a0monitor\u00a0measurement data while a script is running, including an early view of buffered results, rather than waiting for the full test to finish.<\/p>\n<p>This programmable parallel control helps engineers coordinate sophisticated tests with less manual programming and PC interaction. Combined with TSP-Link, the MP5000 Series system can synchronize source changes across channels and connected mainframes to within 500 nanoseconds, allowing one channel to respond precisely to events or actions on another.<\/p>\n<p>Running multiple channels and test sequences concurrently can increase throughput, improve timing\u00a0accuracy\u00a0and lower the cost of high-channel-count validation and production testing.<\/p>\n<p><strong>A modular system designed to adapt and scale\u00a0<\/strong><\/p>\n<p>The\u00a0MSMU200-2 is the second SMU available for the MP5000 Series\u00a0system, following the 60-volt MSMU60-2 introduced last year. The platform also supports the dual-channel, 50-watt MPSU50-2ST\u00a0power supply module.<\/p>\n<p>Engineers can combine SMU and power supply modules in the same three-slot MP5103 mainframe, configuring up to six SMU and\/or PSU channels in a compact 1U rack space. This allows teams to select the combination of voltage, current, precision and cost each test requires, then adapt the system as devices, applications and channel requirements evolve.<\/p>\n<p>Individual slot controls allow engineers to stop and restart a slot from the front panel when inserting, removing, or replacing a module. This\u00a0helps\u00a0eliminate\u00a0the need to power down and unplug the entire mainframe, helping preserve uptime as systems are serviced or reconfigured. Rear-accessible modules can also be exchanged without removing the mainframe from the test rack.<\/p>\n<p><strong>Availability\u00a0<\/strong><\/p>\n<p>The MSMU200-2 SMU module and new\u00a0TriggerFlow\u00a0interface in TSP Toolkit are available now.\u00a0Explore\u00a0the\u00a0<a href=\"https:\/\/www.globenewswire.com\/Tracker?data=ltKZVtUTUpQveadi4dD-XGVYpIi0zuUbMWeEjDDZsezSo2m7Vi9gdhsRmgDNnuxiSGRnMyviL40ANkqxGBqQUMxNyzMCt1b2TFrtl7VAW1Px7gjH5aUobjku9e83JtLrVQwAHE3YHZBZpyCHE2q64tlTFUpsRd6kf2uhOexaQXLU5Xf3GF8StC-_UJ7z7_-7KHWN-uotQ6MNgyK4xYokEQ==\" target=\"_blank\" rel=\"noopener\">MP5000 Series\u00a0Modular Precision Test\u00a0System<\/a>.<\/p>\n<p># # #<\/p>\n<p><strong>About Tektronix\u00a0<\/strong><\/p>\n<p>Tektronix is the partner engineers have trusted to measure, discover, and innovate for 80 years. Today we deliver test and measurement solutions that unite precision with simplicity, helping engineers accelerate breakthroughs that shape a better tomorrow. Learn more at\u00a0<a href=\"https:\/\/www.globenewswire.com\/Tracker?data=fJQFgzLWNKkG5UKFUj6eGuVvRrjGsf_ixkrgXpYOXW6gOTALn6BfNoX3OYXs_QLnqiUYGmWp0KHYkAFrqqPSwxAhIlPyyEz1hXBJTJQaB2I=\" target=\"_blank\" rel=\"noopener\">tek.com\/newsroom<\/a>.<\/p>\n<p>Tektronix is a registered trademark of Tektronix, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks of their respective companies.<\/p>\n<p>SOURCE: Tektronix, Inc.<\/p>\n<pre><strong>Media Contacts:\u00a0\u00a0<\/strong>\r\n\r\nmedia@tektronix.com\u00a0\u00a0\r\n\r\nContact Info\r\n\r\n\r\nTektronix\r\n<a href=\"https:\/\/www.globenewswire.com\/Tracker?data=Wm4wLcSJwP74O9WFv_lCZ23imG6dQ58-RzwTiEQR2qC7qCr-KyjPgFtoKSncA0K5QrcjF4p6X5L-HbgPOMFg0xHsuDeZTfsqKmURMiwbVT0=\" target=\"_blank\" rel=\"noopener\">media@tektronix.com<\/a><\/pre>\n<p><strong>Attachment<\/strong><\/p>\n<ul>\n<li><a href=\"https:\/\/ml.globenewswire.com\/Resource\/Download\/7dfbe761-c92f-4992-bc35-aade192fbdef\" target=\"_blank\" rel=\"noopener\">MP5000 mainframes racked touchscreen<\/a><\/li>\n<\/ul>\n<p><img \/><br \/>\n<img \/><i><span style=\"font-weight: 400;\">AGENCIA EFE S.A.U.,S.M.E. shall not be liable for any information contained in this message and assumes no responsibility towards third parties in relation to its contents, being expressly exempt from any liability that the author may have in relation to the information in question. Agencia EFE reserves the right to distribute the press release on the news wire, or to publish it on EFE Comunica.<\/span><\/i><\/p>\n<\/div>\n<div><\/div>\n","protected":false},"excerpt":{"rendered":"<p>(Statement issued by the company (Announcement) Tektronix\u00a0today\u00a0announced the MSMU200-2 Source Measure Unit (SMU) module for the MP5000 Series\u00a0Modular\u00a0Precision Test\u00a0System. The new module expands\u00a0the platform to support higher-voltage semiconductor characterization, device [&hellip;]<\/p>\n","protected":false},"author":198164071,"featured_media":48434,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_jetpack_newsletter_access":"","_jetpack_dont_email_post_to_subs":false,"_jetpack_newsletter_tier_id":0,"_jetpack_memberships_contains_paywalled_content":false,"_wpcom_ai_launchpad_first_post":false,"_jetpack_feature_clip_id":0,"_jetpack_memberships_contains_paid_content":false,"footnotes":"","jetpack_post_was_ever_published":false},"categories":[125518],"tags":[],"class_list":["post-243732","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-globenewswire-en"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Tektronix expands MP5000 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